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厄米-高斯光束焦斑的可视化研究

通过高数值孔径(1.45 NA)物镜紧聚焦产生的纵向焦场,采用光诱导力显微镜(PiFM)进行成像检测。实测PiFM结果与基于极化针尖-玻璃基底偶极-偶极相互作用计算的纵向场分布高度吻合(仅因开环针尖扫描器的未校正非线性误差观察到轻微偏差)。

PiFM visualization of z-component of gaussian focus on glass
比例尺:1微米。图像提供:Ananth Tamma(光诱导力显微镜图像)与Fei Huang(场模型模拟),加州大学尔湾分校。

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